Versatile wide range precision spectrophotometer allowing simultaneous measurement of transmittance and reflectance

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Abstract
An optical system is described having three equal paths split from a single beam and recombined into a single beam. A method for electronically processing the signal to obtain the transmittance and reflectance as well as an interfacing system, which allows complete programming of scans and direct data processing, is also described. The results of simultaneous measurements of transmittance and reflectance of amorphous As2S3 and the reflectance squared of crystalline germanium are presented in which a relative precision better than 1×10−4 was achieved. Also mentioned are various applications, such as differential reflectance and measurements with incandescent samples.