Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs

• 14 January 2003
• journal article
• research article
• Published by Wiley in Physica Status Solidi (a)
• Vol. 195  (1) , 81-86
• https://doi.org/10.1002/pssa.200306303

Abstract

Keywords

• 72.80.EY
• 73.40.KP