Applications of surface analysis techniques to photovoltaic research: Grain and grain boundary studies
- 1 January 1981
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 7 (1-2) , 55-68
- https://doi.org/10.1016/0378-5963(81)90060-x
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Correlation of grain boundary electrical properties with grain boundary impurities in multigrained silicon using surface analytical techniquesSolar Cells, 1980
- Evidence for the segregation of impurities to grain boundaries in multigrained silicon using Auger electron spectroscopy and secondary ion mass spectroscopyApplied Physics Letters, 1980
- Thin-film GaAs solar cells with grain-boundary edge passivationApplied Physics Letters, 1979
- Directionally solidified solar-grade silicon using carbon cruciblesJournal of Crystal Growth, 1979
- The effects of grain boundaries on the performance of thin film photovoltaic devicesThin Solid Films, 1979
- The effects of grain boundary and interface recombination on the performance of thin-film solar cellsSolid-State Electronics, 1978
- Grain-boundary edge passivation of GaAs films by selective anodizationApplied Physics Letters, 1978
- Zero-bias resistance of grain boundaries in neutron-transmutation-doped polycrystalline siliconJournal of Applied Physics, 1978
- Electronic processes at grain boundaries in polycrystalline semiconductors under optical illuminationIEEE Transactions on Electron Devices, 1977
- Theory of Photoconductivity in Semiconductor FilmsPhysical Review B, 1956