Novel technique for measuring the Q factor of thin-film lumped elements at microwave frequencies

16 October 1969

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 5 (21) , 535-536
https://doi.org/10.1049/el:19690401

Abstract

Using higher-order resonances, it is possible to determine the Q factors of thin-film lumped elements at microwave frequencies. This technique avoids any perturbation of the experimental arrangement which normally arises from insertion and removal of the unknown.

Keywords

FREQUENCIES USING
USING HIGHER
HIGHER ORDER
ORDER RESONANCES
TECHNIQUE AVOIDS
NOVEL TECHNIQUE
EXPERIMENTAL ARRANGEMENT
PERTURBATION

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