Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam
- 1 July 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 12 (7) , 816-818
- https://doi.org/10.1109/68.853510
Abstract
The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.Keywords
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