Dynamic atomic force microscopy methods

• 1 September 2002
• journal article
• Published by Elsevier in Surface Science Reports
• Vol. 47  (6-8) , 197-301
• https://doi.org/10.1016/s0167-5729(02)00077-8

Abstract

Keywords

• 68.37PS
• 07.79.LH
• 87.64.DZ
• ATOMIC FORCE MICROSCOPY
• TAPPING-MODE AFM
• AMPLITUDE MODULATION AFM
• FREQUENCY MODULATION AFM
• DYNAMIC FORCE MICROSCOPY
• SCANNING PROBE MICROSCOPY