Alpha-particle-induced failure modes in dynamic RAMs
- 3 January 1985
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 21 (1) , 38-39
- https://doi.org/10.1049/el:19850029
Abstract
The alpha-particle-induced soft error rates of 64K D-RAMs made by five leading manufacturers have been compared. Different samples from the same manufacturer, and those from four different manufacturers, are all shown to be very similar, but the fifth manufacturers product has a soft error rate that is an order of magnitude larger than the others. The results also suggest that, for most products, sensitivity is in the bit lines or sense amplifiers, while for those from the fifth manufacturer it resides in the cells.Keywords
This publication has 2 references indexed in Scilit:
- Alpha-Particle-Induced Soft Errors and 64K Dynamic RAM Design Interaction8th Reliability Physics Symposium, 1980
- Component/System Correlation of Alpha Induced Dynamic RAM Soft Failure Rates8th Reliability Physics Symposium, 1979