Magneto-optical characteristics of double-layered amorphous RE-Fe films by rf sputtering

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Abstract
Amorphous GdFe/TbFe double‐layered films have been prepared by rf sputtering on glass substrates. GdFe films of about 300 A in thickness, TbFe films of about 500 A in thickness and SiOx films of about 900 A in thickness were successively deposited without breaking vacuum. The coercivity and polar Kerr rotation angle were measured as a function of rare‐earth content. From these results, the optimum component of GdFe/TbFe double‐layered films was determined. The coercivity of GdFe single‐layered films and the GdFe layer in GdFe/TbFe double‐layered films were also measured by polar Kerr hysteresis loops. It was found that the GdFe layer and the TbFe layer were exchange‐coupled, since the coercivity of the GdFe layer in double‐layered films was more than 10 times larger than that of GdFe single‐layered films. Amorphous GdFe/TbFe double‐layered media of the optimum component have been prepared on 200‐mm‐diam glass disks. A carrier‐to‐noise ratio (C/N) of 45 dB at 2.048 Mb/s (NRZ) was obtained, which is a few dB higher than that of TbFe single‐layered films.

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