Effect of coherency strain and misfit dislocations on the mode of growth of thin films
- 1 March 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 26 (1) , 129-134
- https://doi.org/10.1016/0040-6090(75)90172-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Misfit dislocations and the alignment of epitaxial islandsSurface Science, 1972
- Pseudomorphism in the (100) Ni-Cu systemThin Solid Films, 1969
- Accommodation of misfit across the interface between single-crystal films of various face-centred cubic metalsPhilosophical Magazine, 1966