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Iterative Exhaustive Pattern Generation for Logic Testing
Home
Publications
Iterative Exhaustive Pattern Generation for Logic Testing
Iterative Exhaustive Pattern Generation for Logic Testing
DT
D. T. Tang
D. T. Tang
CC
C. L. Chen
C. L. Chen
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1 March 1984
journal article
Published by
IBM
in
IBM Journal of Research and Development
Vol. 28
(2)
,
212-219
https://doi.org/10.1147/rd.282.0212
Abstract
No abstract available
Cited
Cited by 52 articles
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