A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films
- 1 April 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 67 (1-4) , 407-412
- https://doi.org/10.1016/0169-4332(93)90345-c
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Direct evidence for compositional fluctuation in sputtered Co-Cr thin filmsJournal of Magnetism and Magnetic Materials, 1992
- A system for systematically preparing atom-probe field-ion-microscope specimens for the study of internal interfacesReview of Scientific Instruments, 1990
- Field-ion microscope atom probe studies of metallic glassesPhilosophical Magazine Part B, 1985
- Atom probe field ion microscopy of a FeNiB glassActa Metallurgica, 1982