Measurement of Internal Friction in Thin Films
- 1 May 1963
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 34 (5) , 522-523
- https://doi.org/10.1063/1.1718423
Abstract
A technique for measuring internal friction in thin films (∼2000 Å thick) has been developed. The film is deposited onto a 1‐μ‐thick ribbon of fused quartz having a Q∼5000 and which is clamped at one end. The ribbon and film are set into clamped‐free flexural vibration (∼100 cps) and the vibration is monitored by means of a light beam and photocell. The measurement of the vibration decay constant is expedited by using a logarithmic amplifier. Film relaxation peaks with Q∼300 can be measured at temperatures up to several hundred °C. As an example of the use of the technique, the Snoek relaxation of C in bcc Fe has been measured in a 2500‐Å Fe film.Keywords
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