Abstract
Precise measurements of the electrical conductivity sigma (T) are presented for Cu100-xTix (x=37, 40, 50, 56, 59) metallic glasses between 1.5 and 25K. The temperature and concentration dependences can be essentially accounted for by quantum interference and electron-electron interaction corrections. Characteristic magnetic fields describing the strength of inelastic and spin-orbit scattering as well as the screening factors are consistent with results from the magnetoresistivity.