Noise transfer characteristics of a correlated double sampling circuit
- 1 October 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 33 (10) , 1028-1030
- https://doi.org/10.1109/tcs.1986.1085840
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A MOS switched-capacitor instrumentation amplifierIEEE Journal of Solid-State Circuits, 1982
- Spectral distribution of a sampled 1st-order lowpass filtered white noiseElectronics Letters, 1981
- Characterization of surface channel CCD image arrays at low light levelsIEEE Journal of Solid-State Circuits, 1974