Phase Multiplication

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Abstract
A new multiple-beam interference microscope is described. This makes use of very sensitive sharp fringes of equal thickness. These fringes can be produced in the double-layer interferometer with white, quasi-monochromatic or laser beams. The microscope consists of two inverted microscopes with conjugate mirrors such that the length of the first microscope is a multiple of that of the second one. The first microscope can be replaced by a multi-mode laser and the microscope with conjugate mirrors forms the image of the object either in transmission or at reflection. A high axial resolution can be obtained without reducing the transverse resolution. The volume resolution of the microscope with conjugate mirrors is increased pN times over that of the single-layer interference microscope, where p is the interference order and N is the reflectivity finesse.

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