Semiconductor photodetectors and electrical noise in optical photodensitometric equipment for quantitative assessment of thin media chromatograms
- 31 December 1970
- journal article
- Published by Elsevier in Journal of Chromatography A
- Vol. 46 (3) , 247-254
- https://doi.org/10.1016/s0021-9673(00)83994-1
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Optical noise in photometric scanning of thin media chromatograms : II. Double-beam difference systemsJournal of Chromatography A, 1969
- Optical noise in photometric scanning of thin media chromatogramsJournal of Chromatography A, 1969