Tandem Mass Spectrometry (MS/MS) for Analysis of Additives in a Rubber Vulcanizate

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Abstract
MS/MS appears to have considerable potential as a means for improved direct mass spectral characterization of organic additives in rubber compounds. In this report, we have shown how daughter-ion, parent-ion, and neutral-loss scans can improve the specificity for identification of organic additive components in rubber vulcanizates. The use of MS/MS to reduce the “chemical noise” in the direct analysis of complex mixtures is demonstrated. MS/MS should not be viewed as a technique that will replace other mass spectral methods in rubber applications. For example, desorption ionization methods, GC/MS, LC/MS and high-resolution mass measurements will still have important roles. MS/MS can serve as a supplemental tool for direct mixture analysis that is both rapid and powerful.

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