Theory and Realization of a Two-Layer Hall Effect Measurement Concept for Characterization of Epitaxial and Implanted Layers of SiC
- 1 January 1996
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
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This publication has 1 reference indexed in Scilit:
- Theory and application of a two-layer Hall techniqueIEEE Transactions on Electron Devices, 1980