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Thermal stability of indium-tin-oxide/
n
-GaAs Schottky diodes
Home
Publications
Thermal stability of indium-tin-oxide/
n
-GaAs Schottky diodes
Thermal stability of indium-tin-oxide/
n
-GaAs Schottky diodes
YA
Y.H. Aliyu
Y.H. Aliyu
DM
D.V. Morgan
D.V. Morgan
RB
R.W. Bunce
R.W. Bunce
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16 January 1992
journal article
Published by
Institution of Engineering and Technology (IET)
in
Electronics Letters
Vol. 28
(2)
,
142-144
https://doi.org/10.1049/el:19920088
Abstract
The thermal degradation of ITO Schottky contacts on GaAs has been studied. The rectifying contacts show rapid degradation with heating and could have serious implications for optoelectronic devices that operate at elevated temperatures.
Keywords
THERMAL DEGRADATION
HEATING
ITO-GAAS
INSNO-GAAS
RECTIFYING CONTACTS
SCHOTTKY DIODES
ITO/N-GAAS
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