Critical areas for finite length conductors
- 1 November 1992
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 32 (11) , 1539-1544
- https://doi.org/10.1016/0026-2714(92)90453-r
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- VLSI Yield Prediction and Estimation: A Unified FrameworkIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986