CREST-a current estimator for CMOS circuits
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to generate accurate estimates of the expected current waveforms efficiently. The original implementation of CREST is extended to circuits containing pass transistors, reconvergent fanout, and feedback, and heuristics to simulate circuits with large reconvergent fanout or feedback blocks efficiently are provided. The results of using CREST on several real circuits are presented.Keywords
This publication has 4 references indexed in Scilit:
- Pattern-independent current estimation for reliability analysis of CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A statistical theory of digital circuit testabilityIEEE Transactions on Computers, 1990
- Derivation of Signal Flow Direction in MOS VLSIIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
- Probabilistic Treatment of General Combinational NetworksIEEE Transactions on Computers, 1975