Field-effect mobility in quantized accumulation layers on ZnO surfaces

Abstract
Measurements are reported of the field-effect mobility μFE in strong accumulation layers on the polar surfaces of ZnO crystals. Results are presented of μFE as a function of surface electron density ΔN (in the range 1012-1014 cm2) and of temperature (2-300 K). By a suitable integration procedure it has been possible to derive from the field-effect data the ordinary conductivity mobility μ as a function of ΔN and temperature. At a fixed temperature both μFE and μ initially rise with increasing ΔN, reach a maximum at ΔN(25)×1013 cm2, and then gradually decrease with a further increase in ΔN. For high ΔN (≳ 1013 cm2) μFE and μ are practically temperature independent; for low ΔN (≲ 3 × 1012) they decrease strongly with decreasing temperature, indicating carrier localization at low temperatures. The results of the conductivity mobility μ agree well with those of the Hall mobility μH reported earlier, and provide further support for the model proposed there of charged scattering centers consisting of large conglomerates of surface ions.