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A method of observing selected areas in electron and optical microscopes
Home
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A method of observing selected areas in electron and optical microscopes
A method of observing selected areas in electron and optical microscopes
JN
J F Nankivell
J F Nankivell
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1 May 1953
journal article
Published by
IOP Publishing
in
British Journal of Applied Physics
Vol. 4
(5)
,
141-143
https://doi.org/10.1088/0508-3443/4/5/304
Abstract
No abstract available
Cited
Cited by 15 articles
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