Electron microscopy ofin‐situion beam sputtered amorphous Gd‐Fe alloy thin films
- 1 March 1978
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 49 (3) , 1741-1743
- https://doi.org/10.1063/1.324853
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Different origin of the perpendicular anisotropy in amorphous Gd-Fe from Gd-Co filmsIEEE Transactions on Magnetics, 1977
- Lorentz microscopy on amorphous films with perpendicular anisotropy as a function of temperaturePhysica Status Solidi (a), 1976
- Submicrometer Stripes and Bubbles in Amorphous FilmsIBM Journal of Research and Development, 1976
- The Structure of Sputtered Very Thin Films of Gd‐Co and Gd‐Co‐Mo Amorphous FilmsAIP Conference Proceedings, 1976
- On the question of microcrystallites in some amorphous materials. An electron microscope investigationPhysica Status Solidi (a), 1974
- Electron microscopy of amorphous Gd-Co alloy thin filmsPhysica Status Solidi (a), 1973
- Instrumentation for In Situ Electron Microscope Studies of Sputtered Thin Film GrowthReview of Scientific Instruments, 1972
- Coherent Scattering in a Random-Network Model for Amorphous SolidsPhysical Review Letters, 1972
- Structural and Magnetic Properties of Sputtered NiFe Films Grown in a dc Discharge EnvironmentJournal of Applied Physics, 1964