A density comparison of silicon artifacts between NML (Australia) and NBS (U.S.)
- 1 July 1985
- journal article
- Published by National Institute of Standards and Technology (NIST) in Journal of Research of the National Bureau of Standards
- Vol. 90 (4) , 285-287
- https://doi.org/10.6028/jres.090.016
Abstract
The densities of four silicon artifacts were measured in SI units to 1 × 10-6 by NML (Australia) and NBS (U.S.). Agreement is within the experimental uncertainty of each laboratory. Two of the artifacts had been used in the determination of the Avogadro constant at NBS. The remaining two objects had been used at NBS to establish silicon density artifacts available as a Standard Reference Material (SRM).Keywords
This publication has 0 references indexed in Scilit: