Microstructural characterization of nanograin tin oxide gas sensors
- 1 January 1997
- journal article
- Published by Elsevier in Nanostructured Materials
- Vol. 9 (1-8) , 43-52
- https://doi.org/10.1016/s0965-9773(97)00017-2
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- New approaches for improving semiconductor gas sensorsPublished by Elsevier ,2001
- Dislocations in nanocrystalline SnO2 thin filmsPhilosophical Magazine Letters, 1996
- Ultrafine grain-size tin-oxide films for carbon monoxide monitoring in urban environmentsSensors and Actuators B: Chemical, 1995
- SnO2 sensors: current status and future prospectsSensors and Actuators B: Chemical, 1995
- Structure of tin oxide layers and operating temperature as factors determining the sensitivity performances to NOxSensors and Actuators B: Chemical, 1993
- Grain size effects on gas sensitivity of porous SnO2-based elementsSensors and Actuators B: Chemical, 1991
- Hall measurement studies and an electrical conduction model of tin oxide ultrafine particle filmsJournal of Applied Physics, 1982
- Preparation by reactive deposition and some physical properties of amorphous tin oxide films and crystalline SnO2 filmsThin Solid Films, 1981
- Electrical Properties of Tin Oxide Ultrafine Particle FilmsJournal of the Electrochemical Society, 1981
- Thin-film semiconductor NOxsensorIEEE Transactions on Electron Devices, 1979