Determination of funnel length from cross section versus LET measurements
- 1 December 1993
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 40 (6) , 1910-1917
- https://doi.org/10.1109/23.273464
Abstract
A method is proposed for determining the funnel length from heavy ion upset cross section versus LET data for bulk technologies having an epi layer.This publication has 4 references indexed in Scilit:
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- Rate prediction for single event effects-a critiqueIEEE Transactions on Nuclear Science, 1992
- Determination of SEU parameters of NMOS and CMOS SRAMsIEEE Transactions on Nuclear Science, 1991
- Charge Collection Measurements for Heavy Ions Incident on n- and p-Type SiliconIEEE Transactions on Nuclear Science, 1983