Decay of excited atoms in absorbing dielectrics

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Abstract
We present calculations of the rates of decay of an excited atom embedded in an absorbing dielectric. Decay can occur by spontaneous emission into transverse radiative modes of the electromagnetic field and by Joule heating via longitudinal coupling of the atom to the dielectric. The spontaneous emission (transverse) decay rate is modified in a dielectric, being the free-space rate multiplied by the real part of the refractive index at the transition frequency of the atom. There is a further modification due to the difference between the macroscopic dielectric field and the local field at the position of the atom. In addition there is a longitudinal decay rate which is proportional to the imaginary part of the dielectric constant and therefore vanishes in non-absorbing media. We derive expressions for each of these rates of decay and discuss the physical mechanisms leading to them.