Dual-Ramp A/D Converter Error Due to Nonideal Integrator Capacitor
- 1 March 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 24 (1) , 33-39
- https://doi.org/10.1109/TIM.1975.4314365
Abstract
It is shown that very high accuracy hybrid packaged dual-ramp analog-to-digital converters can be built using ceramic NPO-type chip capacitors that exhibit a dielectric absorption specification of 0.75 percent. Capacitor recovery voltage is shown versus time for several 0.01-/g-m/F NPO-type ceramic capacitors. An absorptive capacitor model for the NPO capacitor is shown. Typical component values for an absorptive model of an 0.01-/g=m/F NPO capacitor are determined. The worst case integrator error due to dielectric absorption in a particular synchro-to-digital converter utilizing two dual-ramp converters with 0.01-/g=m/F integrator capacitors is shown to be in the order of microvolts.Keywords
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