Dielectric screening theory in the local-density-functional formalism. Application to silicon using Slater exchange

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Abstract
The expression for the dielectric matrix, in the local-density-functional formalism, is evaluated for silicon using self-consistent pseudopotential electron energies and wave functions with the Slater exchange-correlation functional. The influence of the local-field effects as well as of the exchange-correlation correction is discussed. The long-wavelength limit of the exchange-correlation correction is determined and compared with existing calculations.