More than a decade of the non-saturating autoclave as a highly accelerated stress technique for evaluating the reliability of nonhermetic microelectronic components
- 1 January 1983
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 23 (5) , 833-836
- https://doi.org/10.1016/0026-2714(83)91007-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- The accelerated ageing of plastic encapsulated semiconductor devices in environments containing a high vapour pressure of waterMicroelectronics Reliability, 1974
- Adsorption of Gases in Multimolecular LayersJournal of the American Chemical Society, 1938