Measurement Technique of Low-Level and Low-Frequency Conductivity Fluctuations

1 September 1985

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. IM-34 (3) , 466-468
https://doi.org/10.1109/tim.1985.4315372

Abstract

In this paper the authors analyze a technique to measure both low-level and low-frequency conductivity fluctuations in noisy environments. This technique is based on a "lock-in detection" circuit with a feedback loop, containing an integrator and a modulator, to obtain a good signal-to-noise ratio and high sensitivity. Fluctuation frequency components lower than 0.01 Hz with sensitivity of 1 V per 100 ppm of mean value variation are achieved with an instrument based on this method.

Keywords

MEASUREMENT TECHNIQUES
FLUCTUATIONS
CONDUCTIVITY MEASUREMENT
INTEGRATED CIRCUIT MEASUREMENTS
CIRCUIT NOISE
WORKING ENVIRONMENT NOISE
LOW-FREQUENCY NOISE
FEEDBACK CIRCUITS
FEEDBACK LOOP
SIGNAL TO NOISE RATIO

This publication has 0 references indexed in Scilit: