Consequences of using the bispherical electrode system for dielectric testing

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Abstract
A method is given for predicting the consequences of using a a bispherical electrode system for conduction and breakdown measurements on dielectrics. Use is made of a special function, which may be defined as the exponential of gradient averaged over a bipolar equipotential surface. As an illustration, the method is applied to measurements by House on the liquid dielectric n hexane, and it is shown that, given two points, the entire gap and stress dependence can be predicted.

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