The thickness dependency of the dielectric constant in certain thin-film dielectrics
- 15 January 1989
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 65 (2) , 872-873
- https://doi.org/10.1063/1.343081
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Structural and electrical properties of rf-sputtered amorphous barium titanate thin filmsJournal of Applied Physics, 1987
- Electrical properties of evaporated zinc sulfide thin filmsThin Solid Films, 1970
- Dielectric Properties of ZnS FilmsJournal of Applied Physics, 1965
- Dielectric Anomaly in ZnS FilmsJournal of Applied Physics, 1962