Narrow track MR head technology
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 32 (1) , 38-42
- https://doi.org/10.1109/20.477547
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Finite element analysis of planar stress anisotropy and thermal behavior in thin filmsIBM Journal of Research and Development, 1990
- Unshielded MR elements with patterned exchange-biasingIEEE Transactions on Magnetics, 1989