Wafer Level IC Burn-in As A Step Towards Bir
- 1 January 1992
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 151-162
- https://doi.org/10.1109/iwlr.1992.657999
Abstract
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This publication has 2 references indexed in Scilit:
- Building-in reliability: making it workPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Evolution of VLSI reliability engineeringPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002