Enhanced secondary ion yield from high charge state ions incident on a metal surface
- 1 September 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 43 (3) , 318-322
- https://doi.org/10.1016/0168-583x(89)90371-6
Abstract
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This publication has 1 reference indexed in Scilit:
- Computer simulations of sputteringNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987