Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement

6 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 218-221
https://doi.org/10.1109/imtc.1988.10854

Abstract

A high-performance algorithm to estimate the four parameters (amplitude, DC offset, frequency and phase) of a sine wave from a sampled data record is presented. The estimation errors are obtained in closed form and can be controlled. The algorithm is non iterative and extremely fast. A Turbo Pascal implementation on the IBM PC/AT requires only a couple of seconds to do a 256-point fit. A method to measure a digitizer's effective bits using this algorithm is presented. Simulation results indicate that the method gives excellent estimates of the true resolution of the simulated ideal digitizer. A 10-point effective-bits plot of a waveform digitizer under test can be accomplished in seconds instead of minutes or even hours as with other iterative algorithms Author(s) Jenq, Y.C. Tektronix Inc., Beaverton, OR, USA Crosby, P.

Keywords

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