Low-concentration oxygen depth profiling by the 16O(d, α)14N reaction
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3) , 289-294
- https://doi.org/10.1016/0029-554x(78)90875-3
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Mass Transport Between Two Metal Layers as Studied by Ion ScatteringJapanese Journal of Applied Physics, 1974
- Theoretical analysis of the energy spectra of back-scattered ionsThin Solid Films, 1973
- Use of the nuclear reaction 16O(d,α)14N in the microanalysis of oxide surface layersNuclear Instruments and Methods, 1973