Quantitative Effects of Substrate Tilt, Curvature and Deposition Position on Orientation in ZnO Films

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1 January 1987

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 381-384
https://doi.org/10.1109/ultsym.1987.198987

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Columnar microstructure in vapor-deposited thin films
Thin Solid Films, 1977