Effects of a non-systematic reflection on thickness extinction contours in dark-field images. II. Contrast mechanisms and theoretical analysis
- 16 December 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 26 (2) , 681-689
- https://doi.org/10.1002/pssa.2210260232
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Effects of a non-systematic reflection on thickness extinction contours in dark-field images. I. Experimental results and comparison with multi-beam theoryPhysica Status Solidi (a), 1974
- A Discussion and Generalization of Bethe's Second-Order ApproximationPhysica Status Solidi (b), 1973
- The critical voltage effect in high voltage electron microscopyPhilosophical Magazine, 1972
- The application of non-systematic many-beam dynamic effects to structure factor determinationActa Crystallographica Section A, 1971