Analysis of photometric properties of occluding edges by the reversed projection blurring model
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 20 (2) , 155-167
- https://doi.org/10.1109/34.659933
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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