Time-resolved evanescent wave induced fluorescence spectroscopy. Part 1.—Deviations in the fluorescence lifetime of tetrasulphonated aluminium phthalocyanine at a fused silica/methanol interface
- 1 January 1991
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in Journal of the Chemical Society, Faraday Transactions
- Vol. 87 (6) , 825-830
- https://doi.org/10.1039/ft9918700825
Abstract
Evanescent wave induced fluorescence spectroscopy and time-correlated single-photon counting have been combined to provide a method of studying the fluorescence decay profiles of fluorophores at a solid/solution interface. Using these techniques the photophysical properties of tetrasulphonated aluminium phthalocyanine (AlS4Pc) in methanol and water solution have been studied at a fused silica interface. In a poor solvent, such as methanol, AlS4Pc is shown to form an adsorbed monolayer on the fused silica surface and exhibit a fluorescence decay profile that deviates from the simple, first-order, single-exponential kinetics of the bulk solution. By changing the solvent to water, which is a good solvent for AlS4Pc, the surface/bulk differences are not observed. The ability of time-resolved fluorescence spectroscopy to distinguish between concentration and quantum-yield effects on evanescent wave induced fluorescence intensity, is clearly demonstrated.Keywords
This publication has 31 references indexed in Scilit:
- Quantitative studies of evanescent wave intensity profiles using optical fluorescenceApplied Optics, 1989
- Diode laser-waveguide spectroscopy in solid argon slabsThe Journal of Physical Chemistry, 1987
- Dynamic Fluorescence Microprobe Method Utilizing Total Internal Reflection PhenomenonChemistry Letters, 1987
- Excitation of Fluorescent Emission from Solutions at the Surface of Polymer Thin-Film Waveguides: An Integrated Optics Technique for the Sensing of Fluorescence at the Polymer/Solution InterfaceApplied Spectroscopy, 1987
- Time-resolved total internal reflection fluorescence spectroscopy for surface photophysics studiesThe Journal of Physical Chemistry, 1986
- Depth-distribution of Fluorescent Species in Silk Fabrics as Revealed by Total Internal Reflection Fluorescence SpectroscopyChemistry Letters, 1986
- Depletion layers in polymer solutions : influence of the chain persistence lengthJournal de Physique Lettres, 1985
- Direct Optical Observation of Interfacial Depletion Layers in Polymer SolutionsPhysical Review Letters, 1982
- Total internal reflection Raman spectroscopyThe Journal of Chemical Physics, 1981
- Solutions de macromolécules rigides : effets de paroi, de confinement et d'orientation par un écoulementJournal de Physique, 1981