Time-Resolved XPS Analysis of the SiO2/Si System in the Millisecond Range
- 26 March 2004
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 108 (17) , 5179-5181
- https://doi.org/10.1021/jp049526m
Abstract
No abstract availableThis publication has 36 references indexed in Scilit:
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