Point-source x-ray backlighting for high-density plasma diagnostics
- 15 January 1983
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 42 (2) , 160-162
- https://doi.org/10.1063/1.93859
Abstract
We have developed a new backlighting method which uses a point x-ray source. It has the advantages of a large magnification factor, high spatial resolution, and freedom from the source intensity nonuniformity. Initial test results and evaluation of this method in comparison with other methods are presented.Keywords
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