Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope
- 1 December 1995
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 34 (12B) , L1692
- https://doi.org/10.1143/jjap.34.l1692
Abstract
Contrast variations of atomic-resolution images were investigated on an InP(110) surface using an ultrahigh-vacuum atomic force microscope (UHV-AFM) in the noncontact mode. The contrast of the atomic-scale AFM image suddenly changed during scanning, which seems to be due to the positional change of the atoms on the tip apex. We observed atomic-scale point defects. These phenomena seem to occur only in monoatomic tip-sample interaction. We also observed an atomic-scale dark area which seems to be due to the convolution of the atomically flat tip and point defects.Keywords
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