Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy
- 2 October 1987
- journal article
- Published by Elsevier in Surface Science
- Vol. 189-190, 15-23
- https://doi.org/10.1016/s0039-6028(87)80409-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Electronic Structure of the Si(111)2 × 1 Surface by Scanning-Tunneling MicroscopyPhysical Review Letters, 1986
- Applications of a high-stability scanning tunneling microscopeIBM Journal of Research and Development, 1986
- Surface modification with the scanning tunneling microscopeIBM Journal of Research and Development, 1986
- Lithography with the scanning tunneling microscopeJournal of Vacuum Science & Technology B, 1986
- Nanometer lithography with the scanning tunneling microscopeApplied Physics Letters, 1985
- Adhesion and micromechanical properties of metal surfacesWear, 1984
- A theory of adhesion at a bimetallic interface: Overlap effectsSurface Science, 1973