A Thermionic Electron Emission Model for Charge Retention in SAMOS Structure
- 1 February 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (2A) , L111-112
- https://doi.org/10.1143/jjap.21.l111
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electrically alterable avalanche-injection-type MOS READ-ONLY memory with stacked-gate structureIEEE Transactions on Electron Devices, 1976
- Interface effects and high conductivity in oxides grown from polycrystalline siliconApplied Physics Letters, 1975
- Optically induced injection of hot electrons into SiO2Journal of Applied Physics, 1974