A New Microwave Measurement Technique to Characterize Diodes and an 800-Gc Cutoff Frequency Varactor at Zero Volts Bias
- 1 January 1964
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 12 (1) , 15-20
- https://doi.org/10.1109/tmtt.1964.1125745
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Waveguide parametric amplifiersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Characterization of Microwave Variable Capacitance DiodesIEEE Transactions on Microwave Theory and Techniques, 1961
- Gallium-Arsenide Point-Contact DiodesIEEE Transactions on Microwave Theory and Techniques, 1961
- Surface-Dependent Losses in Variable Reactance DiodesJournal of Applied Physics, 1959