Structural studies of crystalline and amorphous SiGe alloys using EXAFS and Raman scattering
- 1 December 1983
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 59-60, 541-544
- https://doi.org/10.1016/0022-3093(83)90640-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Raman scattering in hydrogenated amorphous silicon under high pressureSolid State Communications, 1982
- Raman scattering in GeSi alloysSolid State Communications, 1973
- Volume dependence of the Raman frequencies of GeSi alloysSolid State Communications, 1971
- Dielectric Definition of ElectronegativityPhysical Review Letters, 1968